Multi-granularity sampling for simulating concurrent heterogeneous applications
CASES '08 Proceedings of the 2008 international conference on Compilers, architectures and synthesis for embedded systems
Developing platform specific model for MPSoC architecture from UML-based embedded software models
Journal of Systems and Software
Cycle count accurate memory modeling in system level design
CODES+ISSS '09 Proceedings of the 7th IEEE/ACM international conference on Hardware/software codesign and system synthesis
A fast and effective dynamic trace-based method for analyzing architectural performance
Proceedings of the 16th Asia and South Pacific Design Automation Conference
A Model-Driven Design Framework for Massively Parallel Embedded Systems
ACM Transactions on Embedded Computing Systems (TECS)
A fast MPSoC virtual prototyping for intensive signal processing applications
Microprocessors & Microsystems
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To use the tremendous hardware resources available in next generation MultiProcessor Systems-on-Chip (MPSoC) efficiently, rapid and accurate design space exploration (DSE) methods are needed to evaluate the different design alternatives. In this paper, we present a framework that makes fast simulation and performance evaluation of MPSoC possible early in the design flow, thus reducing the time-to-market. In this framework and within the Transaction Level Modeling (TLM) approach, we present a new definition of the timed Programmer's View (PVT) level by introducing two complementary modeling sublevels. The first one, PVT Transaction Accurate (PVT-TA), offers a high simulation speedup factor over the Cycle Accurate Bit Accurate (CABA) level modeling. The second one, PVT Event Accurate (PVT-EA), provides a better accuracy with a still acceptable speedup factor. An MPSoC platform has been developed using these two sublevels including performance estimation models. Simulation results show that the combination of these two sublevels gives a high simulation speedup factor of up to 18 with a negligible performance estimation error margin.