Tessellation Aspect of Combinational Cellular Array Testing

Authors:
Chia-Hsiaing Sung;C. L. Coates
Affiliations:
Department of Electrical Engineering and the Coordinated Science Laboratory, University of Illinois;-
Venue:
IEEE Transactions on Computers
Year:
1974

Citing 2
Cited 1

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Testing for faults in combinational cellular logic arrays

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Testable Sequential Cellular Arrays

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Abstract

This paper introduces procedures which enable one to settle the tessellation problem for the class of combinational cellular arrays with each cell having a binary horizontal input and a binary vertical input. Where all input combinations are applicable to all cells in the array in this class, the necessary number of tests is obtained from necessary prime as well as composite tessellations.