Testing for Intermittent Faults in Digital Circuits
IEEE Transactions on Computers
Intermittent Faults: A Model and a Detection Procedure
IEEE Transactions on Computers
Diagnosis of Intermittent Faults in Combinational Networks
IEEE Transactions on Computers
Effects and detection of intermittent failures in digital systems
AFIPS '69 (Fall) Proceedings of the November 18-20, 1969, fall joint computer conference
A study of intermittent faults in digital computers
AFIPS '77 Proceedings of the June 13-16, 1977, national computer conference
Analysis of a Class of Recovery Procedures
IEEE Transactions on Computers
On switching policies for modular redundancy fault-tolerant computing systems
IEEE Transactions on Computers
A New Approach to the Evaluation of the Reliability of Digital Systems
IEEE Transactions on Computers
IEEE Transactions on Computers
A Simple Random Test Procedure for Detection of Single Intermittent Fault in Combinational Circuits
IEEE Transactions on Computers
Reliability Measure of Hardware Redundancy Fault-Tolerant Digital Systems with Intermittent Faults
IEEE Transactions on Computers
Test-Experiments for Detection and Location of Intermittent Faults in Sequential Circuits
IEEE Transactions on Computers
Model for transient and permanent error-detection and fault-isolation coverage
IBM Journal of Research and Development
Fault isolation in grey systems
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
A novel intermittent fault Markov model for deep sub-micron processors
Proceedings of the 23rd ACM international conference on Great lakes symposium on VLSI
Fault Tolerant Formations Control of UAVs Subject to Permanent and Intermittent Faults
Journal of Intelligent and Robotic Systems
Hi-index | 15.00 |
A continuous-parameter Markov model for intermittent faults in digital systems is presented. This continuous model is more realistic than discrete-parameter models previously presented by other authors. The results obtained using the proposed model can be reduced to those obtained from the previous models, by using appropriate approximations.