Effects and detection of intermittent failures in digital systems

Authors:
M. Ball;F. Hardie
Affiliations:
IBM Corporation, Owego, New York;IBM Corporation, Owego, New York
Venue:
AFIPS '69 (Fall) Proceedings of the November 18-20, 1969, fall joint computer conference
Year:
1969

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Abstract

A great deal has been written during the past few years on the subject of diagnostic test procedures for digital systems. Almost without exception, however, the investigators have limited their interest to the detection and location of solid faults, and their test procedures are usually based on the assumption that either the fault exists for the running time of the test procedure or the time interval between the fault occurrence is less than the required time to run the test.