Error Detection Process Model, Design, and Its Impact on Computer Performance

Authors:
K. G. Shin; Yann-Hang Lee
Affiliations:
Computing Research Laboratory, Department of Electrical and Computer Engineering, University of Michigan;-
Venue:
IEEE Transactions on Computers
Year:
1984

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Abstract

Conventionally, reliability analyses either assume that a fault/error is detected immediately as it occurs, or ignore damage caused by imperfect detection mechanisms and error latency, namely, the time interval between the occurrence of an error and the detection of that error.