Fault isolation in grey systems

Authors:
Stephen Y. H. Su;Hede Ma
Affiliations:
Dept. of Computer Science, Thomas J. Watson School of Engineering, Applied Science and Technology, State University of New York at Binghamton, Binghamton, N. Y.;Dept. of Electrical Engineering, Thomas J. Watson School of Engineering, Applied Science and Technology, State University of New York at Binghamton, Binghamton, N. Y.
Venue:
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
Year:
1988

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Abstract

A grey system is a digital system with the circuit implementation of part or all of its subsystems unknown but the interconnections among all subsystems are known. In this paper, the concepts of grey, white and black systems are formally introduced and developed into logic testing area, i.e. the area of error detection and fault isolation, to find a direction to establish more efficient test schemes for testing digital systems at a reasonable cost. A probabilistic isolation strategy realized by a heuristic and decision-making algorithm is presented to isolate faults in grey systems efficiently in terms of computation space and time.