The Reliability of Memory with Single-Error Correction

Authors:
W. F. Mikhail;R. W. Bartoldus;R. A. Rutledge
Affiliations:
IBM Corporation;-;-
Venue:
IEEE Transactions on Computers
Year:
1982

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Abstract

This correspondence contains the derivation of the reliability, as a function of time, of semiconductor memory with single-error correction. The results are applicable to a wide range of memory organizations.