Fault Model-Driven Test Derivation from Finite State Models: Annotated Bibliography
MOVEP '00 Proceedings of the 4th Summer School on Modeling and Verification of Parallel Processes
EXPERIMENTAL EVALUATION OF FSM-BASED TESTING METHODS
SEFM '05 Proceedings of the Third IEEE International Conference on Software Engineering and Formal Methods
On Easily Diagnosable Sequential Machines
IEEE Transactions on Computers
Totally Preset Checking Experiments for Sequential Machines
IEEE Transactions on Computers
IEEE Transactions on Computers
Restricted Checking Sequences for Sequential Machines
IEEE Transactions on Computers
An Improved Bound for Checking Experiments that Use Simple Input-Output and Characterizing Sequences
IEEE Transactions on Computers
Easily Testable Sequential Machines with Extra Inputs
IEEE Transactions on Computers
Fault-Detection Experiments for Parallel-Decomposable Sequential Machines
IEEE Transactions on Computers
Using formal specifications to support testing
ACM Computing Surveys (CSUR)
Testable Sequential Cellular Arrays
IEEE Transactions on Computers
FSM-based conformance testing methods: A survey annotated with experimental evaluation
Information and Software Technology
Pseudo-exhaustive testing of sequential machines using signature analysis
ITC'84 Proceedings of the 1984 international test conference on The three faces of test: design, characterization, production
A generalized algorithm for constructing checking sequences
IEEE Transactions on Computers
Research: Improving the UIOv-method for protocol conformance testing
Computer Communications
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Some new procedures for designing efficient checking experiments for sequential machines are described. These procedures are based on the use of four types of sequences introduced, namely, the compound DS, the resolving sequence (RS), the compound. RS, and the simple I/O sequence. Significant reduction in the bound on the length of checking experiments is achieved. Along a parallel line of develop