Choose-your-own-adventure routing: lightweight load-time defect avoidance
Proceedings of the ACM/SIGDA international symposium on Field programmable gate arrays
Fault tolerance in transform-domain adaptive filters operating with real-valued signals
IEEE Transactions on Circuits and Systems Part I: Regular Papers
Choose-your-own-adventure routing: Lightweight load-time defect avoidance
ACM Transactions on Reconfigurable Technology and Systems (TRETS)
Microprocessors & Microsystems
A soft error vulnerability analysis framework for Xilinx FPGAs
Proceedings of the 2014 ACM/SIGDA international symposium on Field-programmable gate arrays
A Fault Tolerant Approach for FPGA Embedded Processors Based on Runtime Partial Reconfiguration
Journal of Electronic Testing: Theory and Applications
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Field Programmable Gate Arrays(FPGAs) have been aggressively moving to lower gate length technologies. Such a scaling of technology has an adverse impact on the reliability of the underlying circuits in such architectures. Various different physical phenomena have been recently explored and demonstrated to impact the reliability of circuits both in the form of transient error susceptibility and permanent failures. In this work, we analyze the impact of two different types of hard errors, namely, Time Dependent Dielectric Breakdown (TDDB) and Electro-migration (EM) on FPGAs. We also study the performance degradation of FPGAs over time caused by Hot Carrier Effects (HCE) and Negative Bias Temperature Instability (NBTI). Each such study is performed on the components of FPGAs most affected by the respective phenomena, both from performance and reliability perspective. Different solutions are demonstrated to counter each such failure and degradation phenomena to increase the operating lifetime of the FPGAs.