Conflict driven scan chain configuration for high transition fault coverage and low test power
Proceedings of the 2009 Asia and South Pacific Design Automation Conference
QC-fill: quick-and-cool X-filling for multicasting-based scan test
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
QC-fill: an X-fill method for quick-and-cool scan test
Proceedings of the Conference on Design, Automation and Test in Europe
Test data compression using alternating variable run-length code
Integration, the VLSI Journal
Observation-Oriented ATPG and Scan Chain Disabling for Capture Power Reduction
Journal of Electronic Testing: Theory and Applications
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This article presents a universal-multicasting scan architecture for test compression. By universal multicasting, the authors mean that a specific test pattern can be multicast to a set of any desired scan chains as long as they are compatible. It does require the addition of some extra control bits padded to the compressed test patterns. However, by incorporating techniques such as control pattern encoding, skipping, and partial data reuse, the authors demonstrate that the control overhead can be reduced to a modest level. This method improves the test compression ratio substantially over the recent software-defined multicasting methodology, most notably the segmented addressable scan (SAS). Experimental results indicate that up to 51x test compression ratio in both test data volume and test time can be achieved for a real design with a 1.3% care bit ratio in the test set.