Efficient Online Tests for True Random Number Generators
CHES '01 Proceedings of the Third International Workshop on Cryptographic Hardware and Embedded Systems
A Hardware Random Number Generator
CHES '02 Revised Papers from the 4th International Workshop on Cryptographic Hardware and Embedded Systems
Evaluation Criteria for True (Physical) Random Number Generators Used in Cryptographic Applications
CHES '02 Revised Papers from the 4th International Workshop on Cryptographic Hardware and Embedded Systems
A Design of Reliable True Random Number Generator for Cryptographic Applications
CHES '99 Proceedings of the First International Workshop on Cryptographic Hardware and Embedded Systems
IEEE Transactions on Computers
High-Speed True Random Number Generation with Logic Gates Only
CHES '07 Proceedings of the 9th international workshop on Cryptographic Hardware and Embedded Systems
Design of testable random bit generators
CHES'05 Proceedings of the 7th international conference on Cryptographic hardware and embedded systems
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We briefly address general aspects that reliable security evaluations of physical RNGs should consider. Then we discuss an efficient RNG design that is based on a pair of noisy diodes. The main contribution of this paper is the formulation and the analysis of the corresponding stochastic model which interestingly also fits to other RNG designs. We prove a theorem that provides tight lower bounds for the entropy per random bit, and we apply our results to a prototype of a particular physical RNG.