Physical Demonstration of Polymorphic Self-Checking Circuits

  • Authors:
  • Richard Ruzicka;Lukas Sekanina;Roman Prokop

  • Affiliations:
  • -;-;-

  • Venue:
  • IOLTS '08 Proceedings of the 2008 14th IEEE International On-Line Testing Symposium
  • Year:
  • 2008

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Abstract

Polymorphic gates can be considered as a new reconfigurable technology capable of integrating logic functions with sensing in a single compact structure. Polymorphic gates whose logic function can be controlled by the level of the power supply voltage (Vdd) represent a special class of polymorphic gates. A new polymorphic NAND/NOR gate controlled by Vdd is presented. This gate was fabricated and utilized in a self-checking polymorphic adder. This paper presents an experimental evaluation of this novel implementation.