Computers and Intractability: A Guide to the Theory of NP-Completeness
Computers and Intractability: A Guide to the Theory of NP-Completeness
On Closedness and Test Complexity of Logic Circuits
IEEE Transactions on Computers
Universal Test Sets for Logic Networks
IEEE Transactions on Computers
| Hi-index | 14.98 |
In this correspondence, we present procedures for constructing universal fault detection test sets as well as fault location test sets for multivalued linear circuits, under a multiple stuck-fault model. The bin packing problem is involved in the procedures. The sizes of the fault detection test set and the fault location test set constructed for an n- variable v-valued linear tree circuit are 1 + ?n/(v - 1)? and 1 + ?n/ ?log2 v? ?, respectively. It has been proved that the sizes listed above are optimal for some cases.