A Heuristic Algorithm for the Testing of Asynchronous Circuits
IEEE Transactions on Computers
Boolean Difference for Fault Detection in Asynchronous Sequential Machines
IEEE Transactions on Computers
A Random and an Algorithmic Technique for Fault Detection Test Generation for Sequential Circuits
IEEE Transactions on Computers
Algorithms for Detection of Faults in Logic Circuits
IEEE Transactions on Computers
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The following definition for a fault detection test (fdt) will be used throughout this paper: an input sequence x (of length one or more) for a given network m is a fault detection test for fault fi, located in m, if the output response to x for m with no faults present and the output response to x for m with fi present, differ.