Device and memory array models for flash EEPROM technology

  • Authors:
  • Hassen Aziza;Bertrand Delsuc

  • Affiliations:
  • IM2NP, Institut Materiaux Microelectronique Nanosciences de Provence, UMR 6242 CNRS, University of Marseille, France;ST-Microelectronics, Rousset, France

  • Venue:
  • WSEAS Transactions on Circuits and Systems
  • Year:
  • 2008

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Abstract

In this paper, three EEPROM memory cell models are presented. The first model is a compact model based on Mos Model 11 (MM11) and fully validated on silicon. From this first model we propose two alternative models (level 1 & level 2). These last models allow a reduction of simulation time and memory space overheads, with respect of accuracy, compared to the original compact model. The technique used to build the level 1 and level 2 models is based on the complexity reduction of the original EEPROM model. We also present simulation time results using the different models within memory arrays.