Yield and Cost Analysis of a Reliable NoC

  • Authors:
  • Saeed Shamshiri;Kwang-Ting Cheng

  • Affiliations:
  • -;-

  • Venue:
  • VTS '09 Proceedings of the 2009 27th IEEE VLSI Test Symposium
  • Year:
  • 2009

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Abstract

The yield and cost of a multi-core chip improve significantly through the addition of some spare cores in the system [1]. In this paper, we model the manufacturing and service cost of an NoC with spare wires and routers as well as spare cores. We apply our analysis on an exemplary 9-core processor and on an Intel 80-core processor [2], and show that a spare scheme can significantly improve the reliability, reduce the cost, and substitute for the burn-in process.