Dynamic Test Compaction for Transition Faults in Broadside Scan Testing Based on an Influence Cone Measure

Authors:
Dong Xiang;Boxue Yin;Kwang-Ting Cheng
Affiliations:
-;-;-
Venue:
VTS '09 Proceedings of the 2009 27th IEEE VLSI Test Symposium
Year:
2009

Citing 0
Cited 3

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IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems - Special issue on the 2009 ACM/IEEE international symposium on networks-on-chip
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Test compaction for small-delay defects using an effective path selection scheme

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Abstract

We propose a compact test generation method for transition faults, which is driven by a conflict-avoidance scheme employed during test generation. Based on an influence-cone function for transition faults in broadside scan testing, two dynamic test compaction schemes, named selfish test compaction and unselfish test compaction respectively, are proposed. The selfish test compaction tries to compact as many faults as possible into the current test, while the unselfish scheme attempts to compact the tests of the hard-to-compact faults into the current test. Potential conflicts produced by the signal requirements at the pseudo-primary outputs in the first frame are avoided through the use of an input dependency graph. Experimental results and comparison with existing approaches demonstrate the efficiency and effectiveness of the proposed method.