Design of Diagnosable Sequential Machines Utilizing Extra Outputs
IEEE Transactions on Computers
IEEE Transactions on Computers
Easily Testable Sequential Machines with Extra Inputs
IEEE Transactions on Computers
Signature Testing of Sequential Machines
IEEE Transactions on Computers
Pseudo-exhaustive testing of sequential machines using signature analysis
ITC'84 Proceedings of the 1984 international test conference on The three faces of test: design, characterization, production
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The bound on the length of checking experiments derived by Murakami et al. [1] is improved by using a more efficient output specification in the counter cycle.