IEEE Transactions on Circuits and Systems Part I: Regular Papers
Measuring the uniqueness and variety of analog circuit design features
Integration, the VLSI Journal
A 1.2v 55mW 12bits self-calibrated dual-residue analog to digital converter in 90 nm CMOs
Proceedings of the 17th IEEE/ACM international symposium on Low-power electronics and design
A 12-bit 200-MS/s pipelined A/D converter with sampling skew reduction technique
Microelectronics Journal
An axiomatic model for concept structure description and its application to circuit design
Knowledge-Based Systems
A mismatch-error minimized four-channel time-interleaved 11 b 150 MS/s pipelined SAR ADC
Analog Integrated Circuits and Signal Processing
Integration, the VLSI Journal
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This paper describes a 12-b 120-MS/s dual-channel pipeline analog-to-digital converter (ADC) for high-speed video signal processing. A simple digital midcode calibration technique is proposed to eliminate an offset mismatch between two channels. The proposed sample-and-hold-amplifier-free architecture with correlated input sampling networks enables wideband signal sampling while effectively reducing a gain mismatch between channels. The prototype ADC implemented in a 0.13-µm CMOS technology achieves a peak signal-to-noise-and-distortion ratio of 61.1 dB and a peak spurious-free dynamic range of 74.7 dB for input frequencies up to 60 MHz at 120 MS/s. The measured differential and integral nonlinearities are within ±0.30 LSB and ±0.95 LSB, respectively. The ADC occupies an active die area of 0.56 mm2 and consumes 51.6 mW at a 1.2 V power supply.