Measuring the uniqueness and variety of analog circuit design features

  • Authors:
  • Cristian Ferent;Alex Doboli

  • Affiliations:
  • Department of Electrical and Computer Engineering, State University of New York at Stony Brook, Stony Brook, NY 11794-2350, USA;Department of Electrical and Computer Engineering, State University of New York at Stony Brook, Stony Brook, NY 11794-2350, USA

  • Venue:
  • Integration, the VLSI Journal
  • Year:
  • 2011

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Abstract

Analog circuit design activity is currently a less formalized process, in which the main source for innovation is the designer's ability to produce new designs by combining basic devices, sub-circuits, and ideas from similar solutions. There are few systematic methods that can fuse and transform the useful features of the existing designs into new solutions. Moreover, most automated circuit synthesis tools are still limited to routine tasks, like transistor sizing and layout design. Developing new design techniques that can combine the existing design features requires metrics that describe the uniqueness and variety of the features. This paper evaluates for analog circuits two such general-purpose metrics proposed in [1,2]. Three case studies are discussed on using the metrics to characterize the design features of current mirrors, transconductors, and operational amplifiers. The two metrics and the presented study is useful in producing an overall characterization of analog circuit features. This can help in enhancing the circuit design process, training of young designers, and developing new automated synthesis tools that can explore more solution space regions that are likely to include novel design features.