A Survey of Multivalued Memories
IEEE Transactions on Computers
Synthesis of Multivalued Multithreshold Functions for CCD Implementation
IEEE Transactions on Computers
Heuristic Minimization of MVL Functions: A Direct Cover Approach
IEEE Transactions on Computers
Fault Detection in Combinational Networks by Reed-Muller Transforms
IEEE Transactions on Computers
Spectral Techniques in Digital Logic
Spectral Techniques in Digital Logic
Fault secure multiple-valued logic networks
MVL '78 Proceedings of the eighth international symposium on Multiple-valued logic
Spectral Analysis of Boolean Functions as a Graph Eigenvalue Problem
IEEE Transactions on Computers
Spectral decision diagrams using graph transformations
Proceedings of the conference on Design, automation and test in Europe
A Multiple-Valued Reed-Muller Transform for Incompletely Specified Functions
IEEE Transactions on Computers
Design Verification by Test Vectors and Arithmetic Transform Universal Test Set
IEEE Transactions on Computers
| Hi-index | 14.99 |
Simple transforms for obtaining canonical representation of multiple-valued (MV) functions in polarity k, k in (0, 1,. . ., p/sup n/-1), are presented, where p and n denote the radix and the number of variables of a function. The coefficients in a canonical representation are called spectral coefficients. Various relationships between the functional values of a function and its spectral coefficients are given. Fault detection in an arbitrary MV network is considered using test patterns and spectral techniques. Upper bounds on the number of test patterns for detection of stuck-at and bridging faults at the input lines are shown to be pn and n-1, respectively. Fault detection by spectral techniques is done based on the number of spectral coefficients affected by a fault, and hence it is independent of the technology used for construction of networks and the type of fault. Test set generation for detection of any fault in (E), where (E) denotes all faults in the network, is given. An upper bound on the number of test patterns required to detect all faults in (E) is obtained.