Reed-Muller transforms and their applications for fault detection
Reed-Muller transforms and their applications for fault detection
Spectral Techniques and Fault Detection
Spectral Techniques and Fault Detection
Introduction to Coding Theory
Finite Orthogonal Series in Design of Digital Devices
Finite Orthogonal Series in Design of Digital Devices
Generalized Transforms for Multiple Valued Circuits and Their Fault Detection
IEEE Transactions on Computers
Easily Testable Realizations for Generalized Reed-Muller Expressions
IEEE Transactions on Computers
A Minimal Universal Test Set for Self-Test of EXOR-Sum-of-Products Circuits
IEEE Transactions on Computers
Decision Diagram Method for Calculation of Pruned Walsh Transform
IEEE Transactions on Computers
Generalized Hopfield Neural Network for Concurrent Testing
IEEE Transactions on Computers
Test-Pattern Generation Based on Reed-Muller Coefficients
IEEE Transactions on Computers
A Deterministic Multivariate Interpolation Algorithm for Small Finite Fields
IEEE Transactions on Computers
BIST design for detecting multiple stuck-open faults in CMOS circuits using transition count
Journal of Computer Science and Technology
Design Verification by Test Vectors and Arithmetic Transform Universal Test Set
IEEE Transactions on Computers
Computers and Electrical Engineering
Hi-index | 15.01 |
A new approach for fault detection in combinational networks based on Reed-Muller (RM) transforms is presented. An upper bound on the number of RM spectral coefficients required to be verified for detection of multiple stuck-at-faults and single bridging faults at the input lines of an n-input network is shown to be n. The time complexity (time required to test a network) for detection of multiple terminal faults and the storage required for storing the test are determined. An upper bound is found for the minimum number of test patterns required to detect a fault. The authors present standard tests based on this result, with a simple test generation procedure and upper bounds on minimal numbers of test patterns.