Synthesis of test experiments in some classes of automata
Automatic Control and Computer Sciences
Data structures and algorithms for disjoint set union problems
ACM Computing Surveys (CSUR)
Test Selection Based on Finite State Models
IEEE Transactions on Software Engineering
Protocol testing: review of methods and relevance for software testing
ISSTA '94 Proceedings of the 1994 ACM SIGSOFT international symposium on Software testing and analysis
Testing object-oriented systems: models, patterns, and tools
Testing object-oriented systems: models, patterns, and tools
Optimizing the Length of Checking Sequences
IEEE Transactions on Computers
A Method for the Design of Fault Detection Experiments
IEEE Transactions on Computers
Testing Software Design Modeled by Finite-State Machines
IEEE Transactions on Software Engineering
Fault detecting experiments for sequential circuits
SWCT '64 Proceedings of the 1964 Proceedings of the Fifth Annual Symposium on Switching Circuit Theory and Logical Design
An improved conformance testing method
FORTE'05 Proceedings of the 25th IFIP WG 6.1 international conference on Formal Techniques for Networked and Distributed Systems
Adaptive testing of deterministic implementations specified by nondeterministic FSMs
ICTSS'11 Proceedings of the 23rd IFIP WG 6.1 international conference on Testing software and systems
Evaluating test suite characteristics, cost, and effectiveness of FSM-based testing methods
Information and Software Technology
A practical approach for testing timed deterministic finite state machines with single clock
Science of Computer Programming
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We address the problem of generating tests from a deterministic Finite State Machine to provide full fault coverage even if the faults may introduce extra states in the implementations. It is well-known that such tests should include the sequences in the so-called traversal set, which contains all sequences of length defined by the number of extra states. Therefore, the only apparent opportunity to produce shorter tests is to find within a test suite a suitable arrangement of the sequences in the inescapable traversal set. We observe that the direct concatenation of the traversal set to a given state cover, suggested by all existing generation methods with full fault coverage, results in extensive test branching, when a test has to be repeatedly executed to apply all the sequences of the traversal set. In this paper, we state conditions which allow distributing these sequences over several tests. We then utilize these conditions to elaborate a method, called SPY-method, which shortens tests by avoiding test branching as much as possible. We present the results of the experimental comparison of the proposed method with an existing method which indicate that the resulting save can be up to 40%.