Overall consideration of scan design and test generation

Test sequence compaction by reduced scan shift and retiming

ATS '95 Proceedings of the 4th Asian Test Symposium

On Improving the Stuck-at Fault Coverage of Functional Test Sequences by Using Limited-Scan Operations

ITC '01 Proceedings of the 2001 IEEE International Test Conference

ATPG for heat dissipation minimization during test application

ITC'94 Proceedings of the 1994 international conference on Test

Reduced scan shift: a new testing method for sequential circuits

ITC'94 Proceedings of the 1994 international conference on Test

Autoscan: a scan design without external scan inputs or outputs

IEEE Transactions on Very Large Scale Integration (VLSI) Systems