Fitting standard cell performance to generalized Lambda distributions
Proceedings of the 21st edition of the great lakes symposium on Great lakes symposium on VLSI
The effect of random dopant fluctuations on logic timing at low voltage
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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Editor's note:The strategy to generate statistical model parameters is essential for variability-aware design. Based on 3D atomistic simulation results, this article evaluates the accuracy of statistical parameter generation for two industry-standard compact device models.—Yu Cao, Arizona State University