Clock skew reduction by self-compensating manufacturing variability with on-chip sensors

  • Authors:
  • Shinya Abe;Ken-ichi Shinkai;Masanori Hashimoto;Takao Onoye

  • Affiliations:
  • Osaka University, Suita, Japan;Osaka University, Suita, Japan;Osaka University, Suita, Japan;Osaka University, Suita, Japan

  • Venue:
  • Proceedings of the 20th symposium on Great lakes symposium on VLSI
  • Year:
  • 2010

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Abstract

This paper presents a self-compensation scheme of manufacturing variability for clock skew reduction. In the proposed scheme, a CDN with embedded variability sensors tunes variable clock drivers for canceling the clock skew induced by manufacturing variability. We apply the proposed scheme for a mesh-style CDN in a 65nm technology and evaluate the deskewing effect as a function of the sensor performance. Experimental results show that the skew can be reduced by over 70% and the correlation coefficient between estimated and actual variabilities, which represents the sensor performance, should be more than 0.3 for skew reduction.