A New Built-in TPG Based on Berlekamp---Massey Algorithm

Authors:
Cleonilson Protásio Souza;Francisco Marcos De Assis;Raimundo Carlos Silvério Freire
Affiliations:
Department of Electrical Engineering, Federal University of Paraíba, João Pessoa, Brazil;Department of Electrical Engineering, Federal University of Campina Grande, Campina Grande, Brazil;Department of Electrical Engineering, Federal University of Campina Grande, Campina Grande, Brazil
Venue:
Journal of Electronic Testing: Theory and Applications
Year:
2010

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Abstract

In this work, a new method to design a mixed-mode Test Pattern Generator (TPG) based only on a simple and single Linear Feedback Shift Register (LFSR) is described. Such an LFSR is synthesized by Berlekamp---Massey algorithm (BMA) and is capable of generating pre-computed deterministic test patterns which detect the hard-to-detect faults of the circuit. Moreover, the LFSR generates residual patterns which are sufficient to detect the remaining easy-to-detect faults. In this way, the BMA-designed LFSR is a mixed-mode TPG which achieves total fault coverage with short testing length and low hardware overhead compared with previous schemes according to the experimental results.