The Ballast Methodology for Structured Partial Scan Design
IEEE Transactions on Computers
A Partial Scan Method for Sequential Circuits with Feedback
IEEE Transactions on Computers
Hardware Acceleration Alone Will Not Make Fault Grading ULSI a Reality
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
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