Very large fractional factorial and central composite designs
ACM Transactions on Modeling and Computer Simulation (TOMACS)
Design and Analysis of Experiments
Design and Analysis of Experiments
Efficient reliability simulation of analog ICs including variability and time-varying stress
Proceedings of the Conference on Design, Automation and Test in Europe
Efficient variability-aware NBTI and hot carrier circuit reliability analysis
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Proceedings of the 48th Design Automation Conference
| Hi-index | 0.00 |
This paper demonstrates a deterministic, variability-aware reliability modeling and simulation method. The purpose of the method is to efficiently simulate failure-time dispersion in circuits subjected to die-level stress effects. A Design of Experiments (DoE) with a quasi-linear complexity is used to build a Response Surface Model (RSM) of the time-dependent circuit behavior. This reduces simulation time, when compared to random-sampling techniques, and guarantees good coverage of the circuit factor space. The DoE consists of a linear screening design, to filter out important circuit factors, followed by a resolution 5 fractional factorial regression design to model the circuit behavior. The method is validated over a broad range of both analog and digital circuits and compared to traditional random-sampling reliability simulation techniques. It is shown to outperform existing simulators with a simulation speed improvement of up to several orders of magnitude. Also, it is proven to have a good simulation accuracy, with an average model error varying from 1.5 to 5% over all test circuits.