Fast and robust registration of 3D surfaces using low curvature patches

  • Authors:
  • Van-Due Nguyen;Victor Nzomigni;Charles V. Stewart

  • Affiliations:
  • GE Research & Development, Schenectady, NY;CMA Consulting, Schenectady, NY;Rensselaer Polytechnic Institute, Troy, NY

  • Venue:
  • 3DIM'99 Proceedings of the 2nd international conference on 3-D digital imaging and modeling
  • Year:
  • 1999

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Abstract

This paper describes a new model to range data registration algorithm, specifically designed for accuracy, speed. and robustness. Like many recent registration techniques, our Robust-Closest-Patch algorithm (RCP) iteratively matches model patches to data surfaces based on the current pose and then re-estimates pose based on these matches. RCP has several novel features: 1) on-line registration is driven by low curvature patches computed from the model off-line; 2) an approximate normal distance between a patch and a surface is used, avoiding the need to estimate local surface normal and curvature from noisy data; 3) pose is solved exactly by a linear system in six parameters. using a symmetric formulation of the rotation constraint; 4) robustness is ensured using an M-estimator that estimates both the rigid pose parameters and the error standard deviation. Results are shown using models and range data from turbine blade inspection.