Boundary scan with cellular-based built-in self-test

Authors:
Clay S. Gloster, Jr.;Franc Brglez
Affiliations:
North Carolina A&T State University, and Microelectronics Center of North Carolina, Research Triangle Park, NC;Bell Northem Research and Microelectronics Center of North Carolina, Research Triangle Park, NC
Venue:
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
Year:
1988

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Abstract

We discuss an approach to merging Boundary Scan with Ruilt-In Self-Test. The proposed implementation of Boundary Scan represents a snapshot of the Joint Test Advisory Group Recommendation 1.0, while the Built-In Self-Test implements the features of cellular automata. We examine test patterns generated from two distinct sources, one with registers using cellular automata and the other, based on the conventional LFSR configuration. We analyze and illustrate distinctive effects of these patterns on fault coverage of specific designs.