Parallel computation of non-deterministic algorithms in vlsi

Importance Sampling for Ising Computers Using One-Dimensional Cellular Automata

IEEE Transactions on Computers

Parallel Random Number Generation for VLSI Systems Using Cellular Automata

IEEE Transactions on Computers

Cellular automata circuits for built-in self test

IBM Journal of Research and Development

Cellular Automata-Based Signature Analysis for Built-In Self-Test

IEEE Transactions on Computers

Cellular Automata for Weighted Random Pattern Generation

IEEE Transactions on Computers

Boundary Scan with Built-In Self-Test

IEEE Design & Test

Boundary scan with cellular-based built-in self-test

ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing