Dynamic techniques for yield enhancement of field programmable logic arrays

Authors:
Michael Demjanenko;Shambhu J. Upadhyaya
Affiliations:
Department of Electrical and Computer Engineering, State University of New York at Buffalo, Buffalo, NY;Department of Electrical and Computer Engineering, State University of New York at Buffalo, Buffalo, NY
Venue:
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
Year:
1988

Citing 3
Cited 0

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Abstract

Newly manufactured Field Programmable Logic Arrays (FPLA) often contain crosspoint defects. We present two techniques to mask out the crosspoint faults in standard off-the-shelf FPLAs. Our techniques do not rely on additional logic, hence the effective yield is enhanced with no additional hardware cost. The first method is a dynamic scheme which reconfigures the functional mask to render a faulty FPLA usable. The second method utilizes the unused product lines of the FPLA. With a sufficient number of excess product lines, we show that a defective FPLA is guaranteed to be rendered usable. We have obtained the probability measures for the usability of defective FPLAs both with and without the implementation of this technique.