A knowledge representation scheme for DFT

Authors:
Desmond F. D'Souza
Affiliations:
Microelectronics and Computer Technology Corporation, Austin, Texas
Venue:
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
Year:
1988

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Abstract

The Knowledge Based approach to DFT and test generation depends heavily upon a storehouse of "knowledge" about DFT techniques and their application. The knowledge representation requirements of this Knowledge Based approach are analyzed. An integrated knowledge representation scheme called KRAFT which addresses the representation requirements is presented in detail, and a scenario of use of such a DFT system is outlined. KRAFT is based on principles of types, functional and relational programming.