Threading of multiple scan paths in a VLSI circuit

Authors:
S. Bhawmick;M. S. Khaira;P. P. Mishra;A. Das;A. Dasgupta;P. Palchaudhury
Affiliations:
Dept. of Computer Sc. and Engg., Indian Institute of Technology, Kharagpur, India;Dept. of Computer Sc. and Engg., Indian Institute of Technology, Kharagpur, India;Dept. of Computer Sc. and Engg., Indian Institute of Technology, Kharagpur, India;Dept. of Computer Sc. and Engg., Indian Institute of Technology, Kharagpur, India;Dept. of Computer Sc. and Engg., Indian Institute of Technology, Kharagpur, India;Dept. of Computer Sc. and Engg., Indian Institute of Technology, Kharagpur, India
Venue:
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
Year:
1988

Citing 6
Cited 0

Design for testability — a review of advanced methods

Microprocessors & Microsystems
DFTEXPERT: an expert system for design of testable VLSI circuits

IEA/AIE '88 Proceedings of the 1st international conference on Industrial and engineering applications of artificial intelligence and expert systems - Volume 1
Design of Testable VLSI Circuits with Minimum Area Overhead

IEEE Transactions on Computers
Test generation systems in Japan

DAC '75 Proceedings of the 12th Design Automation Conference
An integrated cad system for design of testable vlsi circuits

An integrated cad system for design of testable vlsi circuits
A Knowledge-Based System for Designing Testable VLSI Chips

IEEE Design & Test

Quantified Score

Hi-index	0.00

Visualization

Abstract

Testing of a VLSI circuit through multiple scan paths achieves concurrency in testing and reduces overall test time. This paper addresses the problem of configuring multiple scan paths in a VLSI circuit. Based on the analysis of the circuit, certain specific subcircuits are identified and a scan path is next configured for testing each such subcircuit. Rather than the algorithmic approach, a Knowledge Based System(KBS) strategy has been adopted in order to automate the approach taken by a human designer to tackle the problem.