DFTEXPERT: an expert system for design of testable VLSI circuits

Authors:
Sudipta Bhawmik;P. Pal Chaudhuri
Affiliations:
Indian Institute of Technology, Kharagpur, India;Indian Institute of Technology, Kharagpur, India
Venue:
IEA/AIE '88 Proceedings of the 1st international conference on Industrial and engineering applications of artificial intelligence and expert systems - Volume 1
Year:
1988

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Abstract

To tackle the current day testing complexity of VLSI circuits Design For Testability (DFT) is becoming more of a necessity. However VLSI designers are yet to accept DFT mainly due to lack of effective tools. Expert Systems technology promises to be an useful means to present to the designer the gamut of DFT knowledge developed so far, primarily by test experts, in a more effective way. DFTEXPERT is an attempt towards this direction. This paper presents the major components of DFTEXPERT and also demonstrates its capability through a small illustration.