Data dependence analysis for intra-register vectorization

Authors:
Patricio Bulić;Veselko Guš tin
Affiliations:
University of Ljubljana, Faculty of Computer and Information science, Ljubljana, Slovenia;University of Ljubljana, Faculty of Computer and Information science, Ljubljana, Slovenia
Venue:
ISPDC'03 Proceedings of the Second international conference on Parallel and distributed computing
Year:
2003

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Abstract

There are a number of data dependence tests that have been proposed in the literature. In each test there is a different trade-off between accuracy and efficiency. The most widely used approximate data dependence tests are the Banerjee inequality and the GCD test; whereas the Omega test is a well-known exact data dependence test. In this paper we present a new, fast data dependence test for array references with linear subscripts, which is used in a vectorizing compiler for microprocessors with a multimedia extension. Our test is suitable for use in a dependence analyser that is organized as a series of tests, progressively increasing in accuracy, as a replacement for the GCD or Banerjee tests.