Defect tolerance in hybrid nano/CMOS architecture using tagging mechanism

  • Authors:
  • Saket Srivastava;Aissa Melouki;Bashir M. Al-Hashimi

  • Affiliations:
  • School of Electronics and Computer Science, University of Southampton, UK;School of Electronics and Computer Science, University of Southampton, UK;School of Electronics and Computer Science, University of Southampton, UK

  • Venue:
  • NANOARCH '09 Proceedings of the 2009 IEEE/ACM International Symposium on Nanoscale Architectures
  • Year:
  • 2009

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Abstract

In this paper we propose two efficient repair techniques for hybrid nano/CMOS architecture to provide high level of defect tolerance at a modest cost. We have applied the proposed techniques to a lookup table(LUT) based Boolean logic approach. The proposed repair techniques are efficient in utilization of spare units and viable for various Boolean logic implementations. We show that the proposed techniques are capable of handling upto 20% defect ratess in hybrid nano/CMOS architecture and upto 14% defect rates for large ISCAS'85 benchmark circuits synthesized into smaller sized LUTs.