Fundamentals of MCM Testing and Design-for-Testability
Journal of Electronic Testing: Theory and Applications - Special issue on multi-chip testing and design for testability
An algorithm for planning collision-free paths among polyhedral obstacles
Communications of the ACM
Robot Motion Planning
Genetic Algorithms for the Traveling Salesman Problem
Proceedings of the 1st International Conference on Genetic Algorithms
AllelesLociand the Traveling Salesman Problem
Proceedings of the 1st International Conference on Genetic Algorithms
High-speed electrical testing of multichip ceramic modules
IBM Journal of Research and Development - POWER5 and packaging
Planning Algorithms
Single-probe traversal optimization for testing of MCM substrate interconnections
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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The positioning, motion coordination and test ordering procedures of new testing equipment for printed circuit boards is presented. The equipment structure consists of four mobile probes whose movements must be coordinated to avoid collisions both with obstacles and with each other. This paper explains the algorithm used to obtain the optimum path between two points in a space with obstacles based on traditional methods but including new ideas to reduce the computation times. A new method for motion coordination that obtains the optimum sequence of consecutive or simultaneous probe movements is also introduced and is based on the decomposition of the sequence of movements into stages in which only movements without interferences are permitted. Finally, the ordering of the tests can be viewed as a traveling salesman problem, and the paper presents the results of various methods when applied to the specific characteristics of the equipment involved.