Random walks in a supply network
Proceedings of the 40th annual Design Automation Conference
Analysis and Optimization of Power Grids
IEEE Design & Test
Fast algorithms for IR drop analysis in large power grid
ICCAD '05 Proceedings of the 2005 IEEE/ACM International conference on Computer-aided design
Hierarchical analysis of power distribution networks
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
A multigrid-like technique for power grid analysis
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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In this paper, we present a fast approximation algorithm for computing IR drops in a VLSI power grid. Assuming that the grid does not have pathological defects, the algorithm can estimate IR drops to within 5% average error, with a run time of less than one second per million nodes. Incremental recomputations with new current source values are even faster. The IR drop profiles have excellent correlation with simulated values, making this approach a viable platform for building automatic grid optimization algorithms.