Highlighted depth-of-field photography: Shining light on focus

Authors:
Jaewon Kim;Roarke Horstmeyer;Ig-Jae Kim;Ramesh Raskar
Affiliations:
MIT Media Lab, Cambridge, MA and Korea Institute of Science and Technology(KIST);MIT Media Lab, Cambridge, MA;MIT Media Lab and Korea Institute of Science and Technology(KIST);MIT Media Lab
Venue:
ACM Transactions on Graphics (TOG)
Year:
2011

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Abstract

We present a photographic method to enhance intensity differences between objects at varying distances from the focal plane. By combining a unique capture procedure with simple image processing techniques, the detected brightness of an object is decreased proportional to its degree of defocus. A camera-projector system casts distinct grid patterns onto a scene to generate a spatial distribution of point reflections. These point reflections relay a relative measure of defocus that is utilized in postprocessing to generate a highlighted DOF photograph. Trade-offs between three different projector-processing pairs are analyzed, and a model is developed to help describe a new intensity-dependent depth of field that is controlled by the pattern of illumination. Results are presented for a primary single snapshot design as well as a scanning method and a comparison method. As an application, automatic matting results are presented.