PAM: a photographic affect meter for frequent, in situ measurement of affect

  • Authors:
  • John P. Pollak;Phil Adams;Geri Gay

  • Affiliations:
  • Cornell University, Ithaca, New York, USA;Cornell University, Ithaca, New York, USA;Cornell University, Ithaca, New York, USA

  • Venue:
  • Proceedings of the SIGCHI Conference on Human Factors in Computing Systems
  • Year:
  • 2011

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Abstract

The assessment of emotion, or affect, is critical for anyone trying to understand human behavior. But there is a problem: affect as a state is frequently changing and difficult to recall and express, yet in research, we typically only assess it via a single questionnaire at the end of a study. This work presents PAM, the Photographic Affect Meter, a novel tool for measuring affect in which users select from a wide variety of photos the one which best suits their current mood. Our findings indicate that PAM-which takes seconds to complete and is designed to run on modern mobile phones and mobile computing devices-demonstrates strong construct validity across two studies and is very well suited for frequent sampling in context. This work provides a tool to researchers in need of frequent assessment of affect and guidance to others interested in developing similar measurement tools.