Modeling and forecasting of manufacturing variations (embedded tutorial)
Proceedings of the 2001 Asia and South Pacific Design Automation Conference
Silicon physical random functions
Proceedings of the 9th ACM conference on Computer and communications security
Physical unclonable functions for device authentication and secret key generation
Proceedings of the 44th annual Design Automation Conference
FPGA Intrinsic PUFs and Their Use for IP Protection
CHES '07 Proceedings of the 9th international workshop on Cryptographic Hardware and Embedded Systems
Extended abstract: The butterfly PUF protecting IP on every FPGA
HST '08 Proceedings of the 2008 IEEE International Workshop on Hardware-Oriented Security and Trust
Characterizing flash memory: anomalies, observations, and applications
Proceedings of the 42nd Annual IEEE/ACM International Symposium on Microarchitecture
An analysis of delay based PUF implementations on FPGA
ARC'10 Proceedings of the 6th international conference on Reconfigurable Computing: architectures, Tools and Applications
DRV-Fingerprinting: using data retention voltage of SRAM cells for chip identification
RFIDSec'12 Proceedings of the 8th international conference on Radio Frequency Identification: security and privacy issues
Hi-index | 0.00 |
We evaluate seven techniques for extracting unique signatures from NAND flash devices based on observable effects of process variation. Four of the techniques yield usable signatures that represent different trade-offs between speed, robustness, randomness, and wear imposed on the flash device. We describe how to use the signatures to prevent counterfeiting and uniquely identify and/or authenticate electronic devices.