Extracting device fingerprints from flash memory by exploiting physical variations

  • Authors:
  • Pravin Prabhu;Ameen Akel;Laura M. Grupp;Wing-Kei S. Yu;G. Edward Suh;Edwin Kan;Steven Swanson

  • Affiliations:
  • UC San Diego, La Jolla CA;UC San Diego, La Jolla CA;UC San Diego, La Jolla CA;Cornell University, Ithaca NY;Cornell University, Ithaca NY;Cornell University, Ithaca NY;UC San Diego, La Jolla CA

  • Venue:
  • TRUST'11 Proceedings of the 4th international conference on Trust and trustworthy computing
  • Year:
  • 2011

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Abstract

We evaluate seven techniques for extracting unique signatures from NAND flash devices based on observable effects of process variation. Four of the techniques yield usable signatures that represent different trade-offs between speed, robustness, randomness, and wear imposed on the flash device. We describe how to use the signatures to prevent counterfeiting and uniquely identify and/or authenticate electronic devices.