Performance bound analysis of analog circuits considering process variations

Authors:
Zhigang Hao;Sheldon X.-D. Tan;Ruijing Shen;Guoyong Shi
Affiliations:
Shanghai Jiao Tong University, Shanghai, China and University of California,Riverside, CA;University of California,Riverside, CA;University of California,Riverside, CA;Shanghai Jiao Tong University, Shanghai, China
Venue:
Proceedings of the 48th Design Automation Conference
Year:
2011

Citing 9
Cited 2

Kharitonov's theorem revisited

Systems & Control Letters
Simulation and sensitivity of linear analog circuits under parameter variations by Robust interval analysis

ACM Transactions on Design Automation of Electronic Systems (TODAES)
Computer Methods for Circuit Analysis and Design

Computer Methods for Circuit Analysis and Design
Fast, non-Monte-Carlo estimation of transient performance variation due to device mismatch

Proceedings of the 44th annual Design Automation Conference
Next-Generation Design and EDA Challenges: Small Physics, Big Systems, and Tall Tool-Chains

ASP-DAC '07 Proceedings of the 2007 Asia and South Pacific Design Automation Conference
Canonical symbolic analysis of large analog circuits with determinant decision diagrams

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Compact representation and efficient generation of s-expanded symbolic network functions for computer-aided analog circuit design

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Efficient approximation of symbolic expressions for analog behavioral modeling and analysis

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Hierarchical approach to exact symbolic analysis of large analog circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

A survey on binary decision diagram approaches to symbolic analysis of analog integrated circuits

Analog Integrated Circuits and Signal Processing
Performance bound analysis of analog circuits in frequency- and time-domain considering process variations

ACM Transactions on Design Automation of Electronic Systems (TODAES)

Quantified Score

Hi-index	0.00

Visualization

Abstract

In this paper, we propose a new performance bound analysis of analog circuits considering process variations. We model the variations of component values as intervals measured from tested chip and manufacture processes. The new method applies a graph-based symbolic analysis and affine interval arithmetic to derive the variational transfer functions of analog circuits (linearized) with variational coefficients in forms of intervals. Then the frequency response bounds (maximum and minimum) are obtained by performing analysis of a finite number of transfer functions given by the Kharitonov's polynomial functions. We show that symbolic de-cancellation is critical for the affine interval analysis. The response bound given by the Kharitonov's functions are conservative given the correlations among coefficient intervals in transfer functions. Experimental results demonstrate the effectiveness of the proposed compared to the Monte Carlo method.