Gain and offset correction methods for analog-to-digital converters

  • Authors:
  • Mustafa Keskin;Mark Chew

  • Affiliations:
  • Mobile and Wireless Group, Broadcom, San Diego, USA;Pacific Gas and Electric Company, San Fransico, USA

  • Venue:
  • Analog Integrated Circuits and Signal Processing
  • Year:
  • 2011

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Abstract

This paper describes a simple offset error (OEC) and two gain error (GEC) correction methods for an analog---digital converter (ADC), which use a dedicated sample-and-hold (S/H) circuit. These three methods are specifically proposed for switched- capacitor (SC) S/H circuits. In these methods, few unit capacitors of main S/H-capacitor are separated for correction. OEC method and one of GEC method uses bottom-plate sampling to correct the sampled voltage. The second GEC method uses charge sharing method between capacitors.