The Ant System Applied to the Quadratic Assignment Problem
IEEE Transactions on Knowledge and Data Engineering
Predicting Defect-Tolerant Yield in the Embedded Core Context
IEEE Transactions on Computers
IBM Journal of Research and Development
Study on Evolutionary Neural Network Based on Ant Colony Optimization
CISW '07 Proceedings of the 2007 International Conference on Computational Intelligence and Security Workshops
Novel yield model for integrated circuits with clustered defects
Expert Systems with Applications: An International Journal
Expert Systems with Applications: An International Journal
Ant colony system: a cooperative learning approach to the traveling salesman problem
IEEE Transactions on Evolutionary Computation
Hi-index | 12.05 |
As the wafer size increases, the clustering phenomenon of defects becomes significant. In addition to clustered defects, various clustering patterns also influence the wafer yield. In fact, the recognition of clustering pattern usually exists fuzziness. However, the wafer yield models in previous studies did not consider the fuzziness of clustering pattern belonging to which shape in recognition. Therefore, the objective of this study is to develop a new fuzzy variable of clustering pattern (FVCP) by using fuzzy logic control, and predict the wafer yield by using back-propagation neural network (BPNN) incorporating ant colony optimization (ACO). The proposed method utilizes defect counts, cluster index (CI), and FVCP as inputs for ACO-BPNN. A simulated study is utilized to demonstrate the effectiveness of the proposed model.