Timed i/o test sequences for discrete event model verification

Authors:
Ki Jung Hong;Tag Gon Kim
Affiliations:
Dept. of EECS, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea;Dept. of EECS, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, Republic of Korea
Venue:
AIS'04 Proceedings of the 13th international conference on AI, Simulation, and Planning in High Autonomy Systems
Year:
2004

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Abstract

Model verification examines the correctness of a model implementation with respect to a model specification. While being described from model specification, implementation prepares to execute or evaluate a simulation model by a computer program. Viewing model verification as a program test this paper proposes a method for generation of test sequences that completely covers all possible behavior in specification at an I/O level. Timed State Reachability Graph (TSRG) is proposed as a means of model specification. Graph theoretical analysis of TSRG has generated a test set of timed I/O event sequences, which guarantees 100% test coverage of an implementation under test.