Area-efficient fault detection during self-recovering microarchitecture synthesis

  • Authors:
  • Ramesh Karri;Alex Orailoğlu

  • Affiliations:
  • Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, Amherst, MA;Department of Computer Science and Engineering, University of California, San Diego, La Jolla, CA

  • Venue:
  • DAC '94 Proceedings of the 31st annual Design Automation Conference
  • Year:
  • 1994

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Abstract