Meta-Cure: a reliability enhancement strategy for metadata in NAND flash memory storage systems

  • Authors:
  • Yi Wang;Luis Angel D. Bathen;Nikil D. Dutt;Zili Shao

  • Affiliations:
  • The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong;University of California, Irvine, CA;University of California, Irvine, CA;The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong

  • Venue:
  • Proceedings of the 49th Annual Design Automation Conference
  • Year:
  • 2012

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Abstract