Design and reliability challenges in nanometer technologies
Proceedings of the 41st annual Design Automation Conference
Statistical design and optimization of SRAM cell for yield enhancement
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Trading off Cache Capacity for Reliability to Enable Low Voltage Operation
ISCA '08 Proceedings of the 35th Annual International Symposium on Computer Architecture
Low Power Design Essentials
Improving cache lifetime reliability at ultra-low voltages
Proceedings of the 42nd Annual IEEE/ACM International Symposium on Microarchitecture
Statistical SRAM analysis for yield enhancement
Proceedings of the Conference on Design, Automation and Test in Europe
A Priority-Based 6T/8T Hybrid SRAM Architecture for Aggressive Voltage Scaling in Video Applications
IEEE Transactions on Circuits and Systems for Video Technology
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In this paper, we investigate the impact of circuit misbehavior due to parametric variations and voltage scaling on the performance of wireless communication systems. Our study reveals the inherent error resilience of such systems and argues that sufficiently reliable operation can be maintained even in the presence of unreliable circuits and manufacturing defects. We further show how selective application of more robust circuit design techniques is sufficient to deal with high defect rates at low overhead and improve energy efficiency with negligible system performance degradation.